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The JIB-4700F combines a hybrid conical objective lens, GENTLEBEAM™ mode, and an in-lens detector system to deliver high-resolution imaging at 1.6 nm under a low accelerating voltage
of 1 kV. Its in-lens Schottky-emission electron gun supports up to 300 nA probe current for rapid, high-resolution analysis. For FIB applications, it uses a high-current-density Ga ion beam with up to 90 nA probe current-ideal for fast ion milling and preparation of specimens for APT and TEM.
Model: JIB-4700F
Manufacturer: JEOL
Handover Date:
Key Features:
Resolution: 1.6 nm @1 kV.
Electron gun: In-lens Schottky-emission
Max probe current (SEM): 300 nA
Max probe current (FIB): 90 nA
Location:
Room 003A, RCC (Ground Floor),
IIT Hyderabad
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