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JEOL ARM200F is an aberration corrected Transmission Electron Microscope works with 200 keV with 2 EDS detectors and post column Electron Energy Loss Spectroscopy (EELS).
Model: ARM 200 F
Manufacturer: JEOL
Available Holders: Standard Single tilt holder
Standard Double tilt holder
Cooling holder
JEOL ARM200F with Probe Corrector
JEOL ARM200F with Probe Corrector
4-segmented STEM detector and C-MOS TEM camera for 4DSTEM CEFID (CEOS Energy Filtering & Imaging Device) for high-resolution EDS/EELS.
New STEM detector with e-ABF technique for enhanced contrast of light/low-Z elements
160 mm² EDS detector for elemental analysis
This system defines cutting-edge performance in atomic-scale materials characterization
STEM resolution: 0.02nm @ 200 kV
STEM Magnification
Low Mag: x 200 to 15,000
Mag: 20,000 to 150,000,000
TEM point resolution: 0.12 nm (Point), 0.07 (Lattice) @ 200 kV
Low Mag: x 50 to 50,000
Mag: 2,000 to 15,000,000
JEOL ARM200F with Image Corrector
JEOL ARM200F with Image Corrector
Electron Holography via integrated biprism
Automated aberration correction with JEOL’s advanced algorithm
Exceptional mechanical/electrical stability for ultra-high resolution
In-situ imaging capabilities for dynamic sample analysis
STEM Resolution 0.082 nm @ 200 kV
STEM Magnification:
Low mag: x 200 to 15,000
Mag: 20,000 to 150,000,000
TEM point resolution 200 kV: 0.27 nm
TEM Point resolution: 0.12nm(Point), 0.07nm (Lattice) @ 200 kV
Low Mag: x 50 to 50,000
Mag: 2,000 to 15,000,000
Location
Location
Room: Room 002 A and B, RCC (Ground Floor),
IIT Hyderabad.
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