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The AFM-TERS system at the SATHI facility can be used for characterizing the sample for spectroscopy/microscopy with nanometer scale resolution.
Model: Ntegra Spectra II
Manufacturer: NTMDT
Key Features
Physical and chemical characterization at the nanoscale
Atomic Force Microscopy
Confocal Raman / Fluorescence Microscopy
Tip Enhanced Raman Scattering
Upright and side illumination for measuring AFM-Raman-TERS from samples
Location:
Room 003B, RCC (Ground Floor),
IIT Hyderabad
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